Application Note

Semiconductor Industry – How to Minimize Power Quality Interruptions

  • Detected voltage sags, swells, interruptions, and impulses as short as 500 ns, enabling rapid identification of power events that disrupt semiconductor tools

  • Reduced unnecessary tool downtime and costly false part replacements by capturing time-stamped power quality data to quickly confirm or rule out power as the root cause

  • Verified SEMI F47 compliance and tool ride-through capability using controlled voltage sag testing, improving fab readiness and customer acceptance of semiconductor equipment